A graphically enhanced discrete computer simulation methodology has been developed. The computer model takes Orientation Image Microscope (OIM) measurements as an input. It also allows user to generate input data based on X-ray or neutron diffraction measurements. The abundant information contained in OIM measurements allows the computer model to incorporate many structural characteristics of polycrystalline materials such as, texture, grain boundary, grain shape and size, phase composition, chemical composition, stored elastic energy, and residual stress. Two dimensional measurements can be used to reassemble three dimensional structures. The input parameters of the model can be obtained from experiments from first principle calculation. Graphical representation allows user to monitor simulation of each structural transformation step and to perform virtual experiments. The computer model has been applied to simulation of oxidation, recrystalization, grain growth, electrodeposition, and diffusion.

• Simulation of texture and microstructure formation in electrodeposition processes
  (e.g. Ni-20%Fe)